Cookies on this website
We use cookies to ensure that we give you the best experience on our website. If you click 'Continue' we will assume that you are happy to receive all cookies and you will not see this message again. Click 'Find out more' for information on how to change your cookie settings.

We present an overview of a wavefront sensor-less adaptive optics scheme for microscopy based upon the optimisation of a metric related to the spatial frequency content of images. Aberrations are expanded as a series of suitable functions that permit the independent optimisation of each aberration mode. A general scheme to derive these modes theoretically and experimentally is presented. Resulting aberration correction is demonstrated in an incoherent transmission imaging system and in a structured illumination microscope.

Original publication




Conference paper

Publication Date