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We present an overview of a wavefront sensor-less adaptive optics scheme for microscopy based upon the optimisation of a metric related to the spatial frequency content of images. Aberrations are expanded as a series of suitable functions that permit the independent optimisation of each aberration mode. A general scheme to derive these modes theoretically and experimentally is presented. Resulting aberration correction is demonstrated in an incoherent transmission imaging system and in a structured illumination microscope.

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