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We describe a self-referencing method of wavefront sensing based on rotated lateral shearing interferometry which is able to measure the local slope of a wavefront. We describe the principle of operation, suggest a number of practical implementations, and present experimental results. We found the difference between two sequential measurements of a nominally flat wavefront to be better than λ/250 root mean square. © 2007 Elsevier B.V. All rights reserved.

Original publication




Journal article


Optics Communications

Publication Date





210 - 216