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We describe a self-referencing method of wavefront sensing based on rotated lateral shearing interferometry which is able to measure the local slope of a wavefront. We describe the principle of operation, suggest a number of practical implementations, and present experimental results. We found the difference between two sequential measurements of a nominally flat wavefront to be better than λ/250 root mean square. © 2007 Elsevier B.V. All rights reserved.

Original publication

DOI

10.1016/j.optcom.2007.09.025

Type

Journal article

Journal

Optics Communications

Publication Date

15/01/2008

Volume

281

Pages

210 - 216