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We demonstrate aberration correction in two-photon microscopy. Specimen-induced aberrations were measured with a modal wavefront sensor, implemented using a ferro-electric liquid crystal spatial light modulator (FLCSLM). Wavefront correction was performed using the same FLCSLM. Axial scanned (xz) images of fluorescently labelled polystyrene beads using an oil immersion lens show restored sectioning ability at a depth of 28 &mgr;m in an aqueous specimen.

Type

Journal article

Journal

J Microsc

Publication Date

11/2000

Volume

200 (Pt 2)

Pages

105 - 108