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Stimulated emission depletion (STED) microscopy provides diffraction-unlimited resolution in fluorescence microscopy. Imaging at the nanoscale, however, requires precise alignment of the depletion and excitation laser foci of the STED microscope. We demonstrate here that adaptive optics can be implemented to automatically align STED and confocal images with a precision of 4.3 ± 2.3 nm.

Type

Journal article

Journal

Opt Lett

Publication Date

01/06/2013

Volume

38

Pages

1860 - 1862

Keywords

Image Processing, Computer-Assisted, Lasers, Microscopy, Fluorescence, Optical Processes