Cookies on this website
We use cookies to ensure that we give you the best experience on our website. If you click 'Continue' we will assume that you are happy to receive all cookies and you will not see this message again. Click 'Find out more' for information on how to change your cookie settings.

In adaptive microscope systems, it is often desirable to dispense with the wavefront sensor and perform aberration correction through optimisation an appropriate quality metric, such as image brightness or sharpness. A sequence of trial aberrations is applied to the adaptive element and the metric values are calculated. The optimum aberration correction is derived from these measurements. An important choice in the design of these correction schemes is the modal aberration expansion. This choice may depend upon several factors, such as the deformable mirror, the optimisation metric, the aberration statistics or the image properties. We discuss these factors with particular reference to microscope imaging. © 2009 SPIE.

Original publication

DOI

10.1117/12.810512

Type

Conference paper

Publication Date

29/06/2009

Volume

7209