Cookies on this website
We use cookies to ensure that we give you the best experience on our website. If you click 'Continue' we will assume that you are happy to receive all cookies and you will not see this message again. Click 'Find out more' for information on how to change your cookie settings.

Photonic integrated circuits (PICs) are important enabling technologies for the developments of areas such as quantum information processing (QIP). Coupled-mode integrated beam splitters (IBS) are widely used in many PICs, so direct and accurate testing of individual IBSs inside a PIC is increasingly desirable, as the development of PICs for QIP is scaled up. Here we demonstrate a solution for component-wise testing of coupled-mode IBSs without limitations on component location and PIC architectures. The method is based on the imaging of an individual IBS with a custom-built multifunctional adaptive optical microscope, combined with the calculation of its beam-splitting ratio through numerical modelling.

Original publication

DOI

10.1364/OL.44.003174

Type

Journal article

Journal

Opt Lett

Publication Date

15/06/2019

Volume

44

Pages

3174 - 3177