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Sensorless adaptive optics is commonly used to compensate specimen-induced aberrations in high-resolution fluorescence microscopy, but requires a bespoke approach to detect aberrations in different microscopy techniques, which hinders its widespread adoption. To overcome this limitation, we propose using wavelet analysis to quantify the loss of resolution due to the aberrations in microscope images. By examining the variations of the wavelet coefficients at different scales, we are able to establish a multi-valued image quality metric that can be successfully deployed in different microscopy techniques. To corroborate our arguments, we provide experimental verification of our method by performing aberration correction experiments in both confocal and STED microscopy using three different specimens.

Original publication

DOI

10.1364/OE.393363

Type

Journal article

Journal

Opt Express

Publication Date

25/05/2020

Volume

28

Pages

16749 - 16763