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Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.

Original publication

DOI

10.1002/adma.201203033

Type

Journal article

Journal

Adv Mater

Publication Date

20/11/2012

Volume

24

Pages

OP309 - OP313

Keywords

Equipment Design, Equipment Failure Analysis, Image Enhancement, Lenses, Microscopy, Fluorescence, Nanotechnology, Solutions